X-ray resolution tests of an off-plane reflection grating for IXO
Publication date: 31 July 2010
Authors: Zeiger, B., et al.
Journal: Proc. SPIE
Volume: 7732
Year: 2010
Copyright: SPIE
We describe the experimental apparatus in use to test an off-plane reflection grating for the soft x-ray (0.3-1.0 keV) bandpass. The grating is a prototype for the X-ray Grating Spectrometer on the International X-ray Observatory (IXO). It has holographically-ruled radial grooves to match the converging beam of a 6.5 m focal length telescope. Laboratory tests are ongoing, with ray tracing indicating that a resolution (DeltaE/E) >3,000 is achievable across the 0.3-1.0 keV bandpass- the requirement to achieve IXO science goals.
This paper was presented at the SPIE conference on Astronomical Instrumentation 2010 conference.
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