Asset Publisher

X-ray resolution tests of an off-plane reflection grating for IXO

X-ray resolution tests of an off-plane reflection grating for IXO

Publication date: 31 July 2010

Authors: Zeiger, B., et al.

Journal: Proc. SPIE
Volume: 7732
Year: 2010

Copyright: SPIE

We describe the experimental apparatus in use to test an off-plane reflection grating for the soft x-ray (0.3-1.0 keV) bandpass. The grating is a prototype for the X-ray Grating Spectrometer on the International X-ray Observatory (IXO). It has holographically-ruled radial grooves to match the converging beam of a 6.5 m focal length telescope. Laboratory tests are ongoing, with ray tracing indicating that a resolution (DeltaE/E) >3,000 is achievable across the 0.3-1.0 keV bandpass- the requirement to achieve IXO science goals.

This paper was presented at the SPIE conference on Astronomical Instrumentation 2010 conference.

Link to publication
Last Update: Sep 1, 2019 8:58:41 AM
12-Aug-2020 17:31 UT

ShortUrl Portlet

Shortcut URL

https://sci.esa.int/s/8Y6264A

Images And Videos

Related Publications

Related Links

See Also

Documentation